APFIM characterization of a high phosphorus Russian RPV weldMILLER, M. K; RUSSELL, K. F.Applied surface science. 1996, Vol 94-95, pp 378-383, issn 0169-4332Conference Paper

Atomic jump lengths in surface diffusion : experiment and theorySENFT, D. C.Applied surface science. 1996, Vol 94-95, pp 231-237, issn 0169-4332Conference Paper

Atomic-scale studies of silver segregation at MgO/Cu heterophase interfacesSHASHKOV, D. A; SEIDMAN, D. N.Applied surface science. 1996, Vol 94-95, pp 416-421, issn 0169-4332Conference Paper

Grain boundary precipitation and segregation in Ni-16Cr-9Fe model materialsTHUVANDER, M; STILLER, K; BLAVETTE, D et al.Applied surface science. 1996, Vol 94-95, pp 343-350, issn 0169-4332Conference Paper

Modelling of the field emission microtriode with emitter covered with porous siliconNICOLAESCU, D; FILIP, V; WILSHAW, P. R et al.Applied surface science. 1996, Vol 94-95, pp 79-86, issn 0169-4332Conference Paper

Nanocrystallization of a Co-Nb-B-C metallic glassLUSBY, T. A; MELMED, A. J.Applied surface science. 1996, Vol 94-95, pp 300-305, issn 0169-4332Conference Paper

Precipitation processes during the early stages of ageing in Al-Cu-Mg alloysRINGER, S. P; HONO, K; POLMEAR, I. J et al.Applied surface science. 1996, Vol 94-95, pp 253-260, issn 0169-4332Conference Paper

IFES'95: International Field Emission SymposiumMILLER, Michael K; KELLY, Thomas F; CAMUS, Patrick P et al.Applied surface science. 1996, Vol 94-95, issn 0169-4332, 532 p.Conference Proceedings

A study of the optimum field emitter shape for vacuum electronics applicationsWANG, B. P; TONG, L.Applied surface science. 1996, Vol 94-95, pp 101-106, issn 0169-4332Conference Paper

Electron emission from carbon fibre tipsMOUSA, M. S.Applied surface science. 1996, Vol 94-95, pp 129-135, issn 0169-4332Conference Paper

Electrostatic analysis of local-electrode atom probesBAJIKAR, S. S; KELLY, T. F; CAMUS, P. P et al.Applied surface science. 1996, Vol 94-95, pp 464-471, issn 0169-4332Conference Paper

Laser photoelectron projection microscopy with subwavelength spatial resolutionKONOPSKY, V. N; SEKATSKII, S. K; LETOKHOV, V. S et al.Applied surface science. 1996, Vol 94-95, pp 148-155, issn 0169-4332Conference Paper

Noble-gas-like mechanism of localized field ionization of nitrogen as detected by field ion appearance energy spectroscopySUCHORSKI, Y; MEDVEDEV, V. K; BLOCK, J. H et al.Applied surface science. 1996, Vol 94-95, pp 217-223, issn 0169-4332Conference Paper

Some comments on the simultaneous desorption of ³He and ⁴HeFORBES, R. G.Applied surface science. 1996, Vol 94-95, pp 73-78, issn 0169-4332Conference Paper

Early field emission studies of semiconductorsFURSEY, G.Applied surface science. 1996, Vol 94-95, pp 44-59, issn 0169-4332Conference Paper

Developing and using the field emitter as a high intensity electron sourceCHARBONNIER, F.Applied surface science. 1996, Vol 94-95, pp 26-43, issn 0169-4332Conference Paper

Field-ion imaging old and newFORBES, R. G.Applied surface science. 1996, Vol 94-95, pp 1-16, issn 0169-4332Conference Paper

Field emission from thin liquid metal filmsMETTERAUER, J.Applied surface science. 1996, Vol 94-95, pp 161-170, issn 0169-4332Conference Paper

A specimen preparation technique for atom probe analysis of the near-surface region of cemented carbidesKVIST, A; ANDREN, H.-O; LUNDIN, L et al.Applied surface science. 1996, Vol 94-95, pp 356-361, issn 0169-4332Conference Paper

Adsorption studies of cobalt on tungsten (110), (100) and (111) planes by probe-hole field emission microscopySHARMA, R. B; ADSOOL, A. D; PRADEEP, N et al.Applied surface science. 1996, Vol 94-95, pp 177-185, issn 0169-4332Conference Paper

An atom probe study of cementite precipitation in autotempered martensite in an Fe-Mn-C alloyTHOMSON, R. C; MILLER, M. K.Applied surface science. 1996, Vol 94-95, pp 313-319, issn 0169-4332Conference Paper

Atomic scale investigation of ordering and precipitation processes in a model Ni-Cr-Al alloySCHMUCK, C; DANOIX, F; CARON, P et al.Applied surface science. 1996, Vol 94-95, pp 273-279, issn 0169-4332Conference Paper

Characterization of ultrasharp field emitters by projection microscopyFRANSEN, M. J; DAMEN, E. P. N; SCHILLER, C et al.Applied surface science. 1996, Vol 94-95, pp 107-112, issn 0169-4332Conference Paper

Comparative studies on enhanced field emission from mechanically and chemically polished broad-area Nb, Cu, and Al cathodesPUPETER, N; HABERMANN, T; KIRSCHNER, A et al.Applied surface science. 1996, Vol 94-95, pp 94-100, issn 0169-4332Conference Paper

Comparison of the rate of decomposition in Fe-45%Cr, Fe-45%Cr-5%Ni and duplex stainless steelsMILLER, M. K; RUSSELL, K. F.Applied surface science. 1996, Vol 94-95, pp 398-402, issn 0169-4332Conference Paper